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Applied Physics Letters / Volume 97 / Issue 24 / BIOPHYSICS AND BIO-INSPIRED SYSTEMS

Appl. Phys. Lett. 97, 243704 (2010); http://dx.doi.org/10.1063/1.3524523 (3 pages)

Quantification of nanoscale density fluctuations using electron microscopy: Light-localization properties of biological cells

Prabhakar Pradhan1, Dhwanil Damania1, Hrushikesh M. Joshi2, Vladimir Turzhitsky1, Hariharan Subramanian1, Hemant K. Roy3, Allen Taflove4, Vinayak P. Dravid2, and Vadim Backman1

1Department of Biomedical Engineering, Northwestern University, Evanston, Illinois 60208, USA
2Department of Material Science and Engineering, Northwestern University, Evanston, Illinois 60208, USA
3Department of Internal Medicine, NorthShore University HealthSystem, Evanston, Illinois 60201, USA
4Department of Electrical Engineering and Computer Science, Northwestern University, Evanston, Illinois 60208, USA

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(Received 18 June 2010; accepted 9 November 2010; published online 17 December 2010)

We report a study of the nanoscale mass-density fluctuations of heterogeneous optical dielectric media, including nanomaterials and biological cells, by quantifying their nanoscale light-localization properties. Transmission electron microscope images of the media are used to construct corresponding effective disordered optical lattices. Light-localization properties are studied by the statistical analysis of the inverse participation ratio (IPR) of the localized eigenfunctions of these optical lattices at the nanoscale. We validated IPR analysis using nanomaterials as models of disordered systems fabricated from dielectric nanoparticles. As an example, we then applied such analysis to distinguish between cells with different degrees of aggressive malignancy.

© 2010 American Institute of Physics

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KEYWORDS and PACS

Keywords

bio-optics, cellular effects of radiation, dielectric materials, eigenvalues and eigenfunctions, nanobiotechnology, nanoparticles, statistical analysis, transmission electron microscopy

PACS

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.3524523

PUBLICATION DATA

ISSN

0003-6951 (print)  
1077-3118 (online)

Publisher

$abstract.society.value is a Member of CrossRef American Institute of Physics

For access to fully linked references, you need to log in.
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    V. N. Prigodin and B. L. Altshular, Phys. Rev. Lett. 80, 1944 (1998).

    P. Pradhan and S. Sridhar, Phys. Rev. Lett. 85, 2360 (2000).

    E. Zeitler and G. F. Bahr, J. Appl. Phys. 33, 847 (1962)JAPIAU000033000003000847000001.


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