• Volume/Page
  • Keyword
  • DOI
  • Citation
  • Advanced
   
 
 
 

Flickr Twitter UniPHY Group iResearch App Facebook

Appl. Phys. Lett. 97, 051112 (2010); http://dx.doi.org/10.1063/1.3477961 (3 pages)

Transient interference implications on the subpicosecond laser damage of multidielectrics

Laurent Gallais1, Benoît Mangote1, Mireille Commandré1, Andrius Melninkaitis2, Julius Mirauskas2, Maksim Jeskevic2, and Valdas Sirutkaitis2

1Institut Fresnel, Ecole Centrale Marseille, CNRS, Aix-Marseille Université, Campus de St Jérôme, 13013 Marseille, France
2Laser Research Center, Vilnius University, Sauletekio Avenue 10, 10223 Vilnius, Lithuania

View MapView Map

(Received 29 June 2010; accepted 19 July 2010; published online 6 August 2010)

Laser-induced damage in optical thin films with subpicosecond pulses is investigated. A model dedicated to optical interference coatings and based on the rate equation for free electron generation is introduced. It takes into account the transient interference effects induced by changes in the dielectric function during the laser pulse and its feedback effect on the electron density distribution in the multilayer stack. Simulations are compared to experiments on HfO2 and Ta2O5 films with pulses ranging from 45 fs to 1 ps. It is shown that this approach can improve the interpretation of femtosecond and picosecond laser induced damage in thin films.

© 2010 American Institute of Physics

RELATED DATABASES

To view database links for this article, you need to log in.

KEYWORDS and PACS

PACS

  • 42.60.-v

    Laser optical systems: design and operation

  • 42.25.Hz

    Interference

  • 78.20.Ci

    Optical constants (including refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity)

  • 42.65.Re

    Ultrafast processes; optical pulse generation and pulse compression

  • 42.79.-e

    Optical elements, devices, and systems

ARTICLE DATA

PUBLICATION DATA

ISSN

0003-6951 (print)  
1077-3118 (online)

For access to fully linked references, you need to log in.
    D. Du, X. Liu, G. Korn, J. Squier, and G. Mourou, Appl. Phys. Lett. 64, 3071 (1994)APPLAB000064000023003071000001.

    W. Kautek, J. Kruger, M. Lenzner, S. Sartania, C. Spielmann, and F. Krausz, Appl. Phys. Lett. 69, 3146 (1996)APPLAB000069000021003146000001.

    M. D. Perry, B. C. Stuart, P. S. Banks, M. D. Feit, V. Yanovsky, and A. M. Rubenchik, J. Appl. Phys. 85, 6803 (1999)JAPIAU000085000009006803000001.

    T. Apostolova and Y. Hahn, J. Appl. Phys. 88, 1024 (2000)JAPIAU000088000002001024000001.

    M. Mero, J. Liu, W. Rudolph, D. Ristau, and K. Starke, Phys. Rev. B 71, 115109 (2005).

    J. Jasapara, A. V. V. Nampoothiri, W. Rudolph, D. Ristau, and K. Starke, Phys. Rev. B 63, 045117 (2001).

    T. Q. Jia, H. Y. Sun, X. X. Li, D. H. Feng, C. B. Li, S. Z. Xu, R. X. Li, Z. Z. Xu, and H. Kuroda, J. Appl. Phys. 100, 023103 (2006)JAPIAU000100000002023103000001.

    L. Gallais, J. Capoulade, J. -Y. Natoli, and M. Commandré, J. Appl. Phys. 104, 053120 (2008)JAPIAU000104000005053120000001.


For access to citing articles, you need to log in.


Figures (3)

Access to article objects (figures, tables, multimedia) requires a subscription; log in to view available files.
(Access to supplementary files, where available, is free for this journal.)



Close
Google Calendar
ADVERTISEMENT

close