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Applied Physics Letters / Volume 97 / Issue 5 / NANOSCALE SCIENCE AND DESIGN

Appl. Phys. Lett. 97, 053110 (2010); http://dx.doi.org/10.1063/1.3467468 (3 pages)

Direct determination of the crystallographic orientation of graphene edges by atomic resolution imaging

S. Neubeck1, Y. M. You2, Z. H. Ni1,2, P. Blake3, Z. X. Shen2, A. K. Geim3, and K. S. Novoselov1

1School of Physics and Astronomy, University of Manchester, Manchester M13 9PL, United Kingdom
2Division of Physics and Applied Physics School of Physical and Mathematical Sciences, Nanyang Technological University, Singapore 637371
3Centre for Mesoscience and Nanotechnology, University of Manchester, Manchester M13 9PL, United Kingdom

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(Received 9 May 2010; accepted 4 June 2010; published online 4 August 2010)

In this letter, we show how high-resolution scanning tunneling microscopy (STM) imaging can be used to reveal that certain edges of micromechanically exfoliated single layer graphene crystals on silicon oxide follow either zigzag or armchair orientation. Using the cleavage technique, graphene flakes are obtained that very often show terminating edges seemingly following the crystallographic directions of the underlying honeycomb lattice. Performing atomic resolution STM-imaging on such flakes, we were able to directly prove this assumption. Raman imaging carried out on the same flakes further validated our findings.

© 2010 American Institute of Physics

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KEYWORDS and PACS

Keywords

crystal orientation, graphene, Raman spectra, scanning tunnelling microscopy

PACS

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.3467468

PUBLICATION DATA

ISSN

0003-6951 (print)  
1077-3118 (online)

Publisher

$abstract.society.value is a Member of CrossRef American Institute of Physics

For access to fully linked references, you need to log in.
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