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Appl. Phys. Lett. 97, 059901 (2010); http://dx.doi.org/10.1063/1.3456727 (2 pages)

Erratum: “Direct chemical synthesis of high coercivity SmCo nanoblades” [ Appl. Phys. Lett. 93, 032505 (2008) ]

C. N. Chinnasamy1, J. Y. Huang2, L. H. Lewis3, C. Vittoria1, and V. G. Harris1

1Department of Electrical and Computer Engineering, Center for Microwave Magnetic Materials and Integrated Circuits, Northeastern University, Boston, Massachusetts 02115-5000, USA
2Sandia National Laboratories, Center for Integrated Nanotechnologies, Albuquerque, New Mexico 87185, USA
3Department of Chemical Engineering, Northeastern University, Boston, Massachusetts 02115-5000, USA

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(Received 22 August 2009; accepted 3 June 2010; published online 2 August 2010)

Abstract unavailable.

EDITORIALLY RELATED

  1. Direct chemical synthesis of high coercivity air-stable SmCo nanoblades
    C. N. Chinnasamy et al.
    Appl. Phys. Lett. 93, 032505 (2008)APPLAB000093000003032505000001

KEYWORDS and PACS

PACS

  • 99.10.Cd

    Errata

  • 75.75.Cd

    Fabrication of magnetic nanostructures

  • 75.50.Cc

    Other ferromagnetic metals and alloys

  • 75.50.Tt

    Fine-particle systems; nanocrystalline materials

  • 75.60.Ej

    Magnetization curves, hysteresis, Barkhausen and related effects

  • 81.16.-c

    Methods of micro- and nanofabrication and processing

ARTICLE DATA

PUBLICATION DATA

ISSN

0003-6951 (print)  
1077-3118 (online)

  1. C. N. Chinnasamy, J. Y. Huang, L. H. Lewis, C. Vittoria, and V. G. Harris, Appl. Phys. Lett. 93, 032505 (2008)APPLAB000093000003032505000001.
  2. V. G. Harris, Y. Chen, A. Yang, S. Yoon, Z. Chen, Anton Geiler, C. N. Chinnasamy, L. H. Lewis, C. Vittoria, E. E. Carpenter, K. J. Carroll, R. Goswami, M. A. Willard, L. Kurihara, M. Gjoka, and O. Kalogirou, J. Phys. D: Appl. Phys. 43, 165003 (2010).


Figures (click on thumbnails to view enlargements)

FIG.1
Composite figure of XRD data. (a) θ−2θ XRD data collected at room temperature using Cu Kα radiation. JCPDS powder diffraction reference files in which the intensity and position of each Bragg peak is represented by a vertical line: (b) Co2C (65-1457), (c) Co3C (26-0450), (d) Sm1Co5 (65-3473), and (e) Sm2Co17 (26-0484) phases. (f) Best fit Rietveld refinement data to raw θ−2θ XRD data.

FIG.1 Download High Resolution Image (.zip file) | Export Figure to PowerPoint



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