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Appl. Phys. Lett. 97, 091904 (2010); http://dx.doi.org/10.1063/1.3475393 (3 pages)

Optical constants of graphene measured by spectroscopic ellipsometry

J. W. Weber1, V. E. Calado2, and M. C. M. van de Sanden1

1Department of Applied Physics, Eindhoven University of Technology, P.O. Box 513, 5600 MB Eindhoven, The Netherlands
2Department of Applied Physics, Delft University of Technology, Lorentzweg 1, 2628 CJ Delft, The Netherlands

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(Received 12 April 2010; accepted 13 July 2010; published online 31 August 2010)

A mechanically exfoliated graphene flake ( ∼ 150×380 μm2) on a silicon wafer with 98 nm silicon dioxide on top was scanned with a spectroscopic ellipsometer with a focused spot ( ∼ 100×55 μm2) at an angle of 55°. The spectroscopic ellipsometric data were analyzed with an optical model in which the optical constants were parameterized by B-splines. This parameterization is the key for the simultaneous accurate determination of the optical constants in the wavelength range 210–1000 nm and the thickness of graphene, which was found to be 3.4 Å.

© 2010 American Institute of Physics

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KEYWORDS and PACS

PACS

  • 78.20.Ci

    Optical constants (including refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity)

  • 78.67.Wj

    Optical properties of graphene

  • 78.40.Ri

    Fullerenes and related materials

ARTICLE DATA

PUBLICATION DATA

ISSN

0003-6951 (print)  
1077-3118 (online)

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