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Appl. Phys. Lett. 97, 091910 (2010); http://dx.doi.org/10.1063/1.3481694 (3 pages)

Low temperature deformation of the R-phase in a NiTiFe shape memory alloy

V. B. Krishnan1, S. B. Shmalo1, C. R. Rathod1, M. A. M. Bourke2, and R. Vaidyanathan1

1Department of Mechanical, Materials and Aerospace Engineering, Advanced Materials Processing and Analysis Center (AMPAC), University of Central Florida, Orlando, Florida 32816, USA
2Los Alamos National Laboratory, Los Alamos, New Mexico 87545, USA

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(Received 16 February 2010; accepted 3 August 2010; published online 3 September 2010)

Deformation in the P3 phase (R-phase) of NiTiFe was investigated by in situ neutron diffraction during compressive loading at cryogenic temperatures. At 216 K, upon loading the R-phase detwinned and subsequently underwent a reversible stress-induced transformation to the B19′ phase (martensite). At 92 K on the other hand, detwinning was suppressed and the stress-induced martensite formed did not transform back upon unloading. The experiments also directly observed a hitherto theoretically predicted B33 phase. Rietveld refinement of the neutron diffraction spectra were used to determine lattice parameters of the B33 and R-phases. Plane-specific elastic moduli were also determined for the R-phase.

© 2010 American Institute of Physics

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KEYWORDS and PACS

PACS

  • 81.40.Lm

    Deformation, plasticity, and creep

  • 62.20.fg

    Shape-memory effect; yield stress; superelasticity

  • 81.40.Jj

    Elasticity and anelasticity, stress-strain relations

  • 62.20.de

    Elastic moduli

  • 64.70.kd

    Metals and alloys

  • 81.30.Kf

    Martensitic transformations

ARTICLE DATA

PUBLICATION DATA

ISSN

0003-6951 (print)  
1077-3118 (online)

For access to fully linked references, you need to log in.
    S. Rajagopalan, A. L. Little, M. A. M. Bourke, and R. Vaidyanathan, Appl. Phys. Lett. 86, 081901 (2005)APPLAB000086000008081901000001.

    C. R. Rathod, B. Clausen, M. A. M. Bourke, and R. Vaidyanathan, Appl. Phys. Lett. 88, 201919 (2006)APPLAB000088000020201919000001.

    S. Qiu, V. B. Krishnan, S. A. Padula II, R. D. Noebe, D. W. Brown, B. Clausen, and R. Vaidyanathan, Appl. Phys. Lett. 95, 141906 (2009)APPLAB000095000014141906000001.

    T. R. Woodruff, V. B. Krishnan, B. Clausen, T. Sisneros, V. Livescu, D. W. Brown, M. A. M. Bourke, and R. Vaidyanathan, Rev. Sci. Instrum. 81, 063903 (2010)RSINAK000081000006063903000001.

    R. Vaidyanathan, M. A. M. Bourke, and D. C. Dunand, J. Appl. Phys. 86, 3020 (1999)JAPIAU000086000006003020000001.


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