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Appl. Phys. Lett. 98, 121104 (2011); http://dx.doi.org/10.1063/1.3568892 (3 pages)

Direct probing of evanescent field for characterization of porous terahertz fibers

Shaghik Atakaramians1,2, Shahraam Afshar V.2, Michael Nagel3, Henrik K. Rasmussen4, Ole Bang5, Tanya M. Monro2, and Derek Abbott1

1Adelaide T-ray Group, School of Electrical and Electronic Engineering, The University of Adelaide, SA 5005, Australia
2Institute for Photonics and Advanced Sensing, School of Chemistry and Physics, The University of Adelaide, SA 5005, Australia
3Institut für Halbleitertechnik, RWTH Aachen University, Sommerfeldstr. 24, 52074 Aachen, Germany
4Department of Mechanical Engineering, Technical University of Denmark, DK-2800 Kongens Lyngby, Denmark
5Department of Photonics Engineering (DTU Fotonik), Technical University of Denmark, DK-2800 Kongens Lyngby, Denmark

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(Received 10 January 2011; accepted 25 February 2011; published online 22 March 2011)

We develop a technique based on a micromachined photoconductive probe-tip to characterize a terahertz (THz) porous fiber. Losses less than 0.08 cm−1 are measured in the frequency range from 0.2 to 0.35 THz, with the minimum of 0.003 cm−1 at 0.24 THz. Normalized group velocity greater than 0.8, which corresponds to dispersion values in between −1.3 and −0.5 ps/m/μm for 0.2<f<0.35 THz are obtained. Moreover, we directly measure the evanescent electric field as a function of frequency. Good agreement between the measured curves and expected theoretical values indicates the low invasiveness of the applied probe-tip.

© 2011 American Institute of Physics

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KEYWORDS and PACS

PACS

  • 42.81.Cn

    Fiber testing and measurement of fiber parameters

  • 42.81.Dp

    Propagation, scattering, and losses; solitons

ARTICLE DATA

PUBLICATION DATA

ISSN

0003-6951 (print)  
1077-3118 (online)

For access to fully linked references, you need to log in.
    J. S. Melinger, N. Laman, S. Sree Harsha, and D. Grischkowsky, Appl. Phys. Lett. 89, 251110 (2006)APPLAB000089000025251110000001.

    S. A. Maier, S. R. Andrews, L. Martin-Moreno, and F. J. Garcia-Vidal, Phys. Rev. Lett. 97, 176805 (2006).

    M. Wächter, M. Nagel, and H. Kurz, Appl. Phys. Lett. 95, 041112 (2009)APPLAB000095000004041112000001.


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