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Appl. Phys. Lett. 98, 132104 (2011); http://dx.doi.org/10.1063/1.3573832 (3 pages)

Transport imaging for contact-free measurements of minority carrier diffusion in GaN, GaN/AlGaN, and GaN/InGaN core-shell nanowires

Lee Baird1, C. P. Ong1, R. Adam Cole1, N. M. Haegel1, A. Alec Talin2, Qiming Li3, and George T. Wang3

1Department of Physics, Naval Postgraduate School, Monterey, California 93950, USA
2Sandia National Laboratories, Livermore, California 94550, USA
3Sandia National Laboratories, Albuquerque, New Mexico 87185, USA

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(Received 10 December 2010; accepted 9 March 2011; published online 30 March 2011)

Minority carrier diffusion lengths (Ld) are measured for GaN, GaN/AlGaN, and GaN/InGaN core-shell nanowires using a technique based on imaging of recombination luminescence. The effect of shell material on transport properties is measured. An AlGaN shell produces Ld values in excess of 1 μm and a relative insensitivity to wire diameter. An InGaN shell reduces effective diffusion length, while a dependence of Ld on diameter is observed for uncoated nanowires.

© 2011 American Institute of Physics

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0003-6951 (print)  
1077-3118 (online)

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