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4 Apr 2011

Volume 98, Issue 14, Articles (14xxxx)

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Appl. Phys. Lett. 98, 141903 (2011); http://dx.doi.org/10.1063/1.3548546 (3 pages)

H. Hattab, A. T. N’Diaye, D. Wall, G. Jnawali, J. Coraux, C. Busse, R. van Gastel, B. Poelsema, T. Michely, F.-J. Meyer zu Heringdorf, and M. Horn-von Hoegen
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Improved charge conduction in cobalt-phthalocyanine thin films grown along 36.8° boundary of SrTiO3 bicrystals

S. Samanta, A. Singh, Arvind Kumar, A. K. Debnath, D. K. Aswal, S. K. Gupta, and J. V. Yakhmi

Appl. Phys. Lett. 98, 143301 (2011); http://dx.doi.org/10.1063/1.3574776 (3 pages) | Cited 5 times

Online Publication Date: 5 April 2011

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We have investigated temperature dependence of resistivity (ρ) and current-voltage characteristics of cobalt-phthalocyanine (CoPc) films deposited (i) along the 36.8° boundary (ATB) and (ii) in the single crystal region (SCR) of SrTiO3 bicrystal substrates. The analyses of ρ-T data show that while ATB films exhibit critical behavior, SCR films follow insulating three-dimensional variable-range-hopping mechanism. The mobility (μ) at 300 K has been estimated to be ∼ 148 and 3.8×10−3 cm2 V−1 s−1, respectively for ATB and SCR films. A very high μ for ATB films indicates that the bicrystal boundary acts as a template for the ordering of CoPc molecules.
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73.61.Ph Polymers; organic compounds
73.50.Dn Low-field transport and mobility; piezoresistance
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