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4 Jul 2011

Volume 99, Issue 1, Articles (01xxxx)

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Appl. Phys. Lett. 99, 011107 (2011); http://dx.doi.org/10.1063/1.3606505 (3 pages)

Kosei Ueno, Satoaki Takabatake, Ko Onishi, Hiroko Itoh, Yoshiaki Nishijima, and Hiroaki Misawa
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Tetracene thin film transistors with polymer gate dielectrics

Simone Bertolazzi, Julia Wünsche, Fabio Cicoira, and Clara Santato

Appl. Phys. Lett. 99, 013301 (2011); http://dx.doi.org/10.1063/1.3606535 (3 pages) | Cited 3 times

Online Publication Date: 6 July 2011

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The use of polymer dielectrics is an important step towards large-area, flexible, and low-cost electronics. In this letter, we study the effect of the polymer dielectrics polystyrene and parylene C on the charge transport properties of tetracene thin films in transistor configuration. By using polymer dielectrics, the tetracene hole mobility increased by more than one order of magnitude, up to 0.2 cm2 V−1 s−1, as compared to bare silicon dioxide. We correlate this result to a favorable morphology of the tetracene films during the early stages of growth.
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85.30.Tv Field effect devices
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On the efficiency of exciton dissociation at the interface between a conjugated polymer and an electron acceptor

M. Wiemer, A. V. Nenashev, F. Jansson, and S. D. Baranovskii

Appl. Phys. Lett. 99, 013302 (2011); http://dx.doi.org/10.1063/1.3607481 (3 pages) | Cited 5 times

Online Publication Date: 6 July 2011

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It is a matter of controversy why excitons can efficiently dissociate into free carriers at an intrinsic polymer/fullerene interface, despite the strong Coulomb interaction between the charges provided by the very low dielectric constant in organic materials. The effect has been ascribed to the presence of intrinsic dipoles on the polymer/fullerene interface, though assuming an unrealistically small carrier effective mass necessary for exciton dissociation. We improve the model showing that it allows realistic carrier effective masses. The dissociation probability is calculated as a function of electric field acting on the dissociating electron-hole pairs.
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71.35.Pq Charged excitons (trions)
72.20.Jv Charge carriers: generation, recombination, lifetime, and trapping
72.80.-r Conductivity of specific materials
77.22.Ch Permittivity (dielectric function)
71.18.+y Fermi surface: calculations and measurements; effective mass, g factor
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Extending the voltage window in the characterization of electrical transport of large-area molecular junctions

Ilias Katsouras, Auke J. Kronemeijer, Edsger C. P. Smits, Paul A. van Hal, Tom C. T. Geuns, Paul W. M. Blom, and Dago M. de Leeuw

Appl. Phys. Lett. 99, 013303 (2011); http://dx.doi.org/10.1063/1.3608154 (3 pages) | Cited 5 times

Online Publication Date: 6 July 2011

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A large bias window is required to discriminate between different transport models in large-area molecular junctions. Under continuous DC bias, the junctions irreversibly break down at fields over 9 MV/cm. We show that, by using pulse measurements, we can reach electrical fields of 35 MV/cm before degradation. The breakdown voltage is shown to depend logarithmically on both duty cycle and pulse width. A tentative interpretation is presented based on electrolysis in the polymeric top electrode. Expanding the bias window using pulse measurements unambiguously shows that the electrical transport exhibits not an exponential but a power-law dependence on bias.
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85.65.+h Molecular electronic devices
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Utilizing n-type vanadium oxide films as hole-extracting layers for small molecule organic photovoltaics

I. Hancox, L. A. Rochford, D. Clare, P. Sullivan, and T. S. Jones

Appl. Phys. Lett. 99, 013304 (2011); http://dx.doi.org/10.1063/1.3607478 (3 pages) | Cited 18 times

Online Publication Date: 7 July 2011

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We report increased cell performance for boron subphthalocyanine chloride (SubPc)/fullerene (C60) organic photovoltaic (OPV) cells when thermally evaporated vanadium oxide (V2OX) thin films are incorporated as a hole-extracting layer at the indium-tin oxide (ITO)/SubPc interface. Ultra-violet photoemission spectroscopy (UPS) studies of the V2OX films reveal highly n-type character, with a large work function of 6.8 eV. This correlates well with recently reported data for other metal oxide hole-extracting layers, such as molybdenum oxide and tungsten oxide, in contrast to the p-type character previously reported for V2OX films. There is significant improvement in energy level alignment for hole-extraction when cells utilise the V2OX layer at the ITO/SubPc interface, resulting in substantial increases in open circuit voltage (VOC) and power conversion efficiency (ηp).
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88.40.hj Efficiency and performance of solar cells
88.40.jr Organic photovoltaics
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