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Applied Physics Letters / Volume 99 / Issue 24 / LASERS, OPTICS, AND OPTOELECTRONICS

Appl. Phys. Lett. 99, 241101 (2011); http://dx.doi.org/10.1063/1.3668099 (3 pages)

Nonlinear optical properties of lanthanum-modified lead zirconate titanate investigated by the femtosecond Z-scan technique

Tsong-Ru Tsai and Chih-Hsiung Yu

Institute of Optoelectronic Sciences, National Taiwan Ocean University, Keelung 20224, Taiwan

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(Received 9 September 2011; accepted 21 November 2011; published online 12 December 2011)

We used a closed-aperture Z-scan technique to study the nonlinear optical refractive index of lanthanum-modified lead zirconate titanate (PLZT) (9/65/35) ceramics. Our laser light source was a mode-locked titanium-sapphire laser, the output pulse width was approximately 100 femtoseconds at a wavelength of 790 nm, and the repetition rate was 10 kHz. We found that PLZT had a large, positive nonlinear optical refractive index, n2 = +(3.1 ± 0.6) × 10−8 esu, and its third-order susceptibility was calculated to be χ(3) = (9 ± 1.8) × 10−9 esu. When an electric field (E) was applied to the PLZT, n2 increased along in direct proportion to E2. We speculate that the increase in n2 was caused by the more ordered structural arrangement of the PLZT imposed by the applied electric field. The results show that PLZT has potential applications in fast, electric-field-controlled nonlinear optical elements.

© 2011 American Institute of Physics

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KEYWORDS and PACS

Keywords

high-speed optical techniques, lanthanum compounds, laser materials processing, lead compounds, nonlinear optical susceptibility, refractive index

PACS

  • 78.47.J-

    Ultrafast spectroscopy (<1 psec)

  • 78.20.Ci

    Optical constants (including refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity)

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.3668099

PUBLICATION DATA

ISSN

0003-6951 (print)  
1077-3118 (online)

Publisher

$abstract.society.value is a Member of CrossRef American Institute of Physics

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