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Applied Physics Letters / Volume 99 / Issue 26 / PLASMAS AND ELECTRICAL DISCHARGES

Appl. Phys. Lett. 99, 261504 (2011); http://dx.doi.org/10.1063/1.3672817 (3 pages)

Comparison of the electron density measurements using Thomson scattering and emission spectroscopy for laser induced breakdown in one atmosphere of helium

E. Nedanovska1, G. Nersisyan1, T. J. Morgan2, L. Hüwel2, C. L. S. Lewis1, D. Riley1, and W. G. Graham1

1Department of Physics and Astronomy, Centre for Plasma Physics, Queen’s University Belfast, BT71NN, United Kingdom
2Department of Physics, Wesleyan University, Middletown, Connecticut 06459, USA

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(Received 21 October 2011; accepted 6 December 2011; published online 28 December 2011)

Thomson scattering from laser-induced plasma in atmospheric helium was used to obtain temporally and spatially resolved electron temperature and density profiles. Electron density measurements at 5 μs after breakdown are compared with those derived from the separation of the allowed and forbidden components of the 447.1 nm He I line. Plasma is created using 9 ns, 140 mJ pulses from Nd:YAG laser at 1064 nm. Electron densities of ∼5 × 1016 cm−3 are in good agreement with Thomson scattering measurements, benchmarking this emission line as a useful diagnostic for high density plasmas.

© 2011 American Institute of Physics

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KEYWORDS and PACS

Keywords

electric breakdown, helium, plasma density, plasma diagnostics, plasma light propagation, plasma temperature

PACS

  • 52.25.Os

    Emission, absorption, and scattering of electromagnetic radiation

  • 52.70.Kz

    Optical (ultraviolet, visible, infrared) measurements

  • 52.80.Vp

    Discharge in vacuum

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.3672817

PUBLICATION DATA

ISSN

0003-6951 (print)  
1077-3118 (online)

Publisher

$abstract.society.value is a Member of CrossRef American Institute of Physics

For access to fully linked references, you need to log in.
    M. Pardede, T. J. Lie, K. H. Kurniawan, H. Niki, K. Fukumoto, T. Maruyama, K. Kagawa, and M. O. Tjia, J. Appl. Phys. 106, 063303 (2009)JAPIAU000106000006063303000001.

    K. F. Al-Shboul, S. S. Harilal, A. Hassanein, and M. Polek, J. Appl. Phys. 109, 053302 (2011)JAPIAU000109000005053302000001.

    K. F. Al-Shboul, S. S. Harilal, and A. Hassanein, Appl. Phys. Lett. 99, 131506 (2011)APPLAB000099000013131506000001.

    E. Salpeter, Phys. Rev. 120, 1528 (1960).

    D. Nassif and L. Hüwel, J. Appl. Phys. 87, 2127 (2000)JAPIAU000087000005002127000001.


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