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Appl. Phys. Lett. 99, 263702 (2011); http://dx.doi.org/10.1063/1.3672224 (3 pages)

Extracellular voltage noise probes the interface between retina and silicon chip

Ralf Zeitler1, Peter Fromherz1, and Günther Zeck2

1Max Planck Institute for Biochemistry, Department of Membrane and Neurophysics, Martinsried, Germany
2Natural and Medical Sciences Institute, Neurochip Research Group, Reutlingen, Germany

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(Received 29 July 2011; accepted 1 December 2011; published online 28 December 2011)

Neuroprosthetic devices rely on a tight contact between electrodes and neurons in the interfaced tissue. A simple method to probe the contact properties in a non-invasive way would be highly attractive. Here we show for retinal tissue that crucial electrical properties of the interface can be extracted from the voltage noise that is recorded with an array of capacitive sensors. The monitoring of the interface properties, which are either interpreted as variable local conductivities or as a cleft of varying distance, allows assessment of the long-term efficiency of neuroprosthetic devices.

© 2011 American Institute of Physics

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0003-6951 (print)  
1077-3118 (online)

For access to fully linked references, you need to log in.
    M. Voelker and P. Fromherz, Phys. Rev. Lett. 96, 228102 (2006).


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